Quantitative dynamic force microscopy with inclined tip oscillation

• Philipp Rahe,
• Daniel Heile,
• Reinhard Olbrich and
• Michael Reichling

Beilstein J. Nanotechnol. 2022, 13, 610–619, doi:10.3762/bjnano.13.53

• tip sampling path. Therefore, one has to take into account that the inclined oscillatory motion of the sensor can invoke significant lateral movement of the tip when describing the Δf signal formation and force deconvolution. If the force field above the surface is homogeneous and isotropic with

• presented by the violet dotted curve in Figure 3e for α = 45°. Last, we note that lateral components are virtually absent for large tip–sample distances in this model, leading to a convergence of the Δf() curves in the regime ≫ 1 nm. Force deconvolution for the inclined sampling path The difference in the

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

• Joachim Welker,
• Esther Illek and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

• the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method

• Sader–Jarvis method. However, the matrix method generally provides the higher deconvolution quality. Keywords: frequency-modulation atomic force microscopy; force deconvolution; numerical implementation; Introduction The atomic force microscope (AFM) was invented 25 years ago as an offspring of the

• change of an oscillating cantilever due to the force field acting between the tip of the probe and the sample surface. The corresponding frequency shift is related to the actual force by a convolution [7]. Hence to obtain the force, deconvolution methods are necessary. A number of inversion methods from